Philips/FEI CM10— a high-resolution instrument (point resolution 0.5 nm; lattice resolution 0.3 nm) suitable for studying materials-science as well as biological specimens because of its ultra-clean vac-ion pumping system and capacity for low-dose imaging. It is equipped with a eucentric goniometer specimen stage allowing tilting through 120 degrees (+/- 60 degrees), and rotation of specimens as they are viewed. A heated stage is also available. Magnification power is in the range of 20X to 510,000X; choice of accelerating potentials between 40 kV and 100 kV. Imaging can be in bright-field mode or dark-field mode (with tilting of the beam about a single plane or through a conical configuration), and electron-diffraction mode (micro-diffraction) operates with camera lengths of from 20 to 9000 mm. Images can be captured using either conventional film, or with a Gatan Bioscan Model 792 digital camera system.
Electron Microscopy Laboratory
Microscopy provides images of the very small, down to the nanometer scale, and for analysis of molecular and elemental composition. The EML (Electron Microscopy Laboratory)offers the tools and technical expertise for research and training in microscopy with both light and electron microscopes. We maintain and operate three electron microscopes (two transmission and one scanning electron microscope), a confocal laser scanning microscope, and the ancillary equipment needed for the preparation of specimens for EM and other microscopy. Our multiple light microscopes encompass optics for bright-field, phase-contrast, differential-interference, and fluorescence imaging. Conventional electron diffraction at a range of camera lengths can be accomplished with the TEMs.
Users of the EML can opt for full technical services in microscopy, so that they are provided with whatever micrographs and analyses are needed for given specimens; or users can work independently on the EML’s microscopes and specimen-preparation equipment following appropriate training by the EML’s staff. Technical service is available for any microscopy-related tasks, such as specimen preparation, microscope operation, and photography.
Courses through the EML staff and the School of Biology and Ecology, where the EML is housed, offer graduate- and upper-undergraduate-level training in the operation of electron microscopes, techniques of microscopy, and analysis of biological ultastructure. Individual tutorials on operation of the EML’s equipment can also be arranged.
For more information contact Kelly Edwards, Electron Microscopy Lab Managerat 11 Murray Hall. Phone: 207.581.2566 Email: email@example.com.
- Microscope operation—full operation of all electron and light microscopes.
- Specimen preservation by chemical and microwave-enhanced fixation.
- Specimen embedment in media suitable for TEM or light microscopy.
- Critical-point-drying of specimens for SEM.
- Metal coating of specimens by evaporative or sputter technology.
- Consulting on techniques of microscopy.
Transmission Electron Microscopes (TEM)
Scanning Electron Microscope (SEM)
AMRay 1820— has a resolution of 5 nm, a magnification range of 20 – 150,000X and an accelerating voltage range of 100 V to 30 kV. Its specimen stage is a eucentric goniometer, meaning that the specimen can be tilted and rotated about the viewing axis. Dynamic focusing accommodates imaging flat specimens. Image capture is fully digital using an iXRF digital-capture system. The microscope is fitted with a high-performance Robinson backscatter detector in addition to the standard secondary electron detector.
Confocal Laser Scanning Microscopy (CLSM)
Leica TCS SP2 Confocal Microscope— equipped with three lasers (Ar, green HeNE, and red HeNe) with available wavelengths of 457-477 nm, 488 nm, 514 nm, 543 nm, and 633 nm.
Critical–point dryer:for drying specimens without subjecting them to the distorting forces of surface tension.
Metal coating by vacuum evaporation and sputter coating such metals as gold, gold-palladium, platinum, chromium, aluminum, and carbon. These are typically used for the preparation of SEM specimens and for producing conductive thin-film supports for TEM.