X-ray Photoelectron (XPS), Ultraviolet Photoelectron (UPS), Auger Electron (AES), High Resolution Electron Energy Loss (HREELS) Several ultra-high vacuum (UHV) systems at FIRST are equipped for the study of surfaces and interfaces using electron spectroscopies (XPS, UPS, AES and HREELS). The Thin Film Synthesis and Characterization Facility includes instrumentation for XPS, UPS and scanning Auger Spectroscopy.